Description
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Product Details
- Edition:
- 2.0
- Published:
- 04/27/2005
- Number of Pages:
- 51
- File Size:
- 1 file , 1000 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
