IEC 60749-13 Ed. 2.0 b:2018 Digital PDF

$57.00

Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
standard by International Electrotechnical Commission, 02/15/2018

Document Format: PDF

Description

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Product Details

Edition:
2.0
Published:
02/15/2018
Number of Pages:
28
File Size:
1 file , 1 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus