IEC 60749-24 Ed. 1.0 b:2005 Digital PDF

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Semiconductor devices – Mechanical and climatic test methods – Part 24: Accelerated moisture resistance – Unbiased HAST
standard by International Electrotechnical Commission, 11/21/2005

Document Format: PDF

Description

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Product Details

Edition:
1.0
Published:
11/21/2005
Number of Pages:
19
File Size:
1 file , 470 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus

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