SAE J2052_201607 Digital PDF

$43.00

Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)
standard by SAE International, 07/12/2016

Document Format: PDF

Description

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Product Details

Published:
07/12/2016
File Size:
1 file , 170 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus

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